Title :
Analysis of Circuit Parameters Using TSD Method
Author :
Stinehelfer, Harold E.
Author_Institution :
Made-It Associates, Inc. 40 West Street Lunenburg, MA 01462
Abstract :
The TSO calibration of the Automatic Network Analyzer uses shorts, thru and delay lines. This calibration is then used to extract or de-embed the parameters of a measured circuit.
Keywords :
Calibration; Capacitance; Circuit analysis; Delay lines; Fixtures; Phase frequency detector; RLC circuits; Reflection; Scattering parameters; Software measurement;
Conference_Titel :
ARFTG Conference Digest-Winter, 34th
Conference_Location :
Ft. Lauderdale, FL, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1989.323961
