DocumentCode :
1835489
Title :
Formal Support for Quantitative Analysis of Residual Risks in Safety-Critical Systems
Author :
Elmqvist, Jonas ; Nadjm-Tehrani, Simin
Author_Institution :
Dept. of Comput. & Inf. Sci., Linkoping Univ., Linkoping
fYear :
2008
fDate :
3-5 Dec. 2008
Firstpage :
154
Lastpage :
164
Abstract :
With the increasing complexity in software and electronics in safety-critical systems new challenges to lower the costs and decrease time-to-market, while preserving high assurance have emerged. During the safety assessment process, the goal is to minimize the risk and particular, the impact of probable faults on system level safety. Every potential fault must be identified and analysed in order to determine which faults that are most important to focus on. In this paper, we extend our earlier work on formal qualitative analysis with a quantitative analysis of fault tolerance. Our analysis is based on design models of the system under construction. It further builds on formal models of faults that have been extended for estimated occurence probability allowing to analyse the system-level failure probability. This is done with the help of the probabilistic model checker PRISM. The extension provides an improvement in the costly process of certification in which all forseen faults have to be evaluated with respect to their impact on safety and reliability. We demonstrate our approach using an application from the avionic industry: an Altitude Meter System.
Keywords :
probability; risk analysis; safety-critical software; software fault tolerance; software metrics; altitude meter system; electronics complexity; fault tolerance; formal support; occurence probability; quantitative analysis; residual risks; safety assessment; safety-critical systems; software complexity; system-level failure probability; time-to-market; Aerospace electronics; Automotive engineering; Costs; Failure analysis; Fault diagnosis; Hazards; Risk analysis; Software safety; System analysis and design; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Assurance Systems Engineering Symposium, 2008. HASE 2008. 11th IEEE
Conference_Location :
Nanjing
ISSN :
1530-2059
Print_ISBN :
978-0-7695-3482-4
Type :
conf
DOI :
10.1109/HASE.2008.59
Filename :
4708874
Link To Document :
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