DocumentCode
1835833
Title
Using Embedded Microcontrollers in Radar Test Equipment
Author
Binney, Richard S. ; Riblett, Loren E.
Author_Institution
Allied-Signal, Inc., Kansas City Division
Volume
17
fYear
1990
fDate
32994
Firstpage
37
Lastpage
46
Abstract
With the recent advancements in microcontroller technology, radar test equipment can be designed to improve the accuracy of measurements being made and simplify designs. An embedded integrator monitor design application (hardware and software) is presented and comparisons are made between the embedded design and the more traditional discrete design approach.
Keywords
Circuits; Communication system control; Computer displays; Embedded software; Hardware; Microcontrollers; Monitoring; Radar equipment; Size control; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 35th
Conference_Location
Dallas, TX, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1990.323978
Filename
4119548
Link To Document