Title :
HAFT: A hybrid FPGA with amorphous and fault-tolerant architecture
Author :
Lin, Mingjie ; Ferguson, Steve ; Ma, Yaling ; Greene, Timothy
Author_Institution :
Electr. Eng. Dept., Stanford Univ., Stanford, CA
Abstract :
We propose a hybrid FPGA architecture with a dense and defective nano-crossbar serving as its configuration memory. An amorphous routing architecture is adopted to optimally allocate logic and routing resource on per-mapping basis and to achieve high logic density. This hybrid FPGA is designed to be efficient in using nano-crosspoints, highly tolerant to memory defects, and versatile to provide features such as variable-granularity logic blocks and variable-length bypassing interconnects. A new placement algorithm and a modified delay-based routing procedure are designed to match with many unconventional architectural features of the proposed FPGA. Assuming zero defect-rate in the nano-crossbar, an FPGA with the proposed architecture can achieve a 30% improvement in logic density, 12% improvement in average net delay, and 8% improvement in the critical-path delay for the largest 20 MCNC benchmark circuits over an island-style baseline with the same nano-scale memory. As the rate of defects in the memory increases from 0% to 50%, this hybrid FPGA remains fully functional and its improvement in logic density and delay performance only drops by approximately 23%.
Keywords :
fault tolerance; field programmable gate arrays; interconnections; logic design; nanotechnology; network routing; MCNC benchmark circuits; amorphous routing architecture; critical-path delay; fault-tolerant architecture; hybrid FPGA; island-style baseline; logic density; logic design; memory defects; modified delay-based routing procedure; nanocrossbar; variable-granularity logic blocks; variable-length bypassing interconnects; Algorithm design and analysis; Amorphous materials; Delay; Fault tolerance; Field programmable gate arrays; Integrated circuit interconnections; Logic circuits; Logic design; Resource management; Routing;
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
DOI :
10.1109/ISCAS.2008.4541676