Title :
Memory layout techniques for variables utilizing efficient DRAM access modes in embedded system design
Author :
Choi, Yoonseo ; Kim, Taewhan
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., South Korea
Abstract :
The delay of memory access is one of the major bottlenecks in embedded systems´ performance. In software compilation, it is known that there are high variations in memory access delay depending on the ways of storing/retrieving the variables in code to/from the memories. In this paper, we propose an effective storage assignment technique for variables to maximize the use of memory bandwidth. Specifically, we study the problem of DRAM memory layout for storing the nonarray variables in code to achieve a maximum utilization of page and/or burst modes for the memory accesses. The contributions of our work are, for each of page and burst modes: (1) We prove that the problem is NP-hard; (2) We propose an exact formulation of the problem and efficient memory layout algorithms, called Solve-MLP for the page mode and Solve-MLB for the burst mode; From experiments with a set of benchmark programs, we confirm that our proposed techniques use on average 20.0% and 9.9% more page accesses and 54.0% and 86.6% more burst accesses than those by OFU (the order of first use) and the technique in P.R. Panda et al. (1997), respectively.
Keywords :
DRAM chips; circuit optimisation; embedded systems; memory architecture; storage allocation; DRAM access mode; NP-hard; OFU; Solve-MLB; Solve-MLP; burst mode; dynamic random access memory; embedded system design; memory access delay; memory bandwidth; memory layout technique; nonarray variable; order of first use; page mode; software compilation; storage assignment technique; Algorithm design and analysis; Bandwidth; Computer science; Delay; Embedded system; Energy consumption; Flow graphs; Information technology; Permission; Random access memory;
Conference_Titel :
Design Automation Conference, 2003. Proceedings
Print_ISBN :
1-58113-688-9
DOI :
10.1109/DAC.2003.1219144