DocumentCode
1836235
Title
Interconnect and noise immunity design for the Pentium® 4 processor
Author
Kumar, Rajesh
Author_Institution
Intel Corp., Hillsboro, OR, USA
fYear
2003
fDate
2-6 June 2003
Firstpage
938
Lastpage
943
Abstract
This paper describes the key challenges, design methods, CAD and learnings in the area of interconnect and noise immunity design for the Intel Pentium® 4 processor. This high frequency (currently at 3 GHz with 6 GHz execution core) design required aggressive domino, pulsed and other novel high speed circuit families that are very noise sensitive. Controlling interconnect delay, capacitive and inductive coupling is of paramount importance at such high frequencies and edge rates, made more difficult by die cost pressures of a high volume chip. We first describe our wire/repeater design methods and silicon results. We then describe a proprietary noise simulator (NoisePad) and our noise robust cell library, both of which were critical to noise robustness. Finally, our test chip results and use of a distributed power grid to manage inductance is described.
Keywords
circuit layout CAD; electric noise measurement; immunity testing; integrated circuit design; integrated circuit interconnections; integrated circuit noise; microprocessor chips; 3 GHz; 6 GHz; Intel Pentium 4 processor; NoisePad; capacitive coupling; die cost pressure; distributed power grid; edge rate; execution core; inductance management; inductive coupling; interconnect delay; interconnect design; noise immunity design; noise robust cell library; noise robustness; proprietary noise simulator; repeater design; silicon result; test chip result; wire design; Circuit noise; Delay; Design automation; Design methodology; Frequency; Integrated circuit interconnections; Noise robustness; Pressure control; Pulse circuits; VHF circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2003. Proceedings
Print_ISBN
1-58113-688-9
Type
conf
DOI
10.1109/DAC.2003.1219155
Filename
1219155
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