DocumentCode
1836374
Title
A model for thermal fatigue of large area adhesive joints between materials with dissimilar thermal expansion
Author
Bjorneklett, Are ; Tuhus, Tom ; Kristiansen, Helge
Author_Institution
SINTEF SI, Oslo, Norway
fYear
1994
fDate
1-3 Feb 1994
Firstpage
138
Lastpage
141
Abstract
A model describing thermal fatigue of large area adhesive joints such as die bonds, has been developed. It is based on equations for crack growth rate and stress distribution in large area joints. The basic assumption of the model is that cracks grow from the edges of the area towards the center. The thermal resistance of the bond layer was calculated by assuming the cracked part of the layer had infinite thermal resistance. The thermal resistance as a function of the number of thermal cycles was predicted to be different for adhesives with low and high modulus of elasticity. Good agreement with previously reported experiments was obtained. The thermal resistance in silver filled die bond adhesives as a function of the number of thermal cycles was measured in these experiments
Keywords
adhesion; filled polymers; microassembling; packaging; thermal expansion; thermal resistance; thermal stress cracking; Ag filled epoxy die bond adhesives; Al; Cu; Cu coated Al substrates; Cu substrates; crack growth rate; die bonds; elastic modulus dependence; electronic packages; large area adhesive joints; stress distribution; thermal cycles; thermal expansion; thermal fatigue model; thermal resistance; Bonding; Electronic packaging thermal management; Fatigue; Joining materials; Silver; System testing; Temperature; Thermal expansion; Thermal resistance; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1994. SEMI-THERM X., Proceedings of 1994 IEEE/CPMT 10th
Conference_Location
San Jose, CA
Print_ISBN
0-7803-1852-8
Type
conf
DOI
10.1109/STHERM.1994.288983
Filename
288983
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