DocumentCode :
1836414
Title :
Outage performance of dual-hop opportunistic relaying compared to a single-hop SIMO under Rayleigh fading
Author :
Katiyar, Himanshu ; Bhattacharjee, Ratnajit
Author_Institution :
Dept. of Electron. & Commun. Eng., Indian Inst. of Technol. Guwahati, Guwahati, India
fYear :
2010
fDate :
29-31 Jan. 2010
Firstpage :
1
Lastpage :
5
Abstract :
Cooperative relaying technique has shown potential in enhancing coverage area and reliability of transmission by forming virtual arrays. Opportunistic relaying tries to utilize best available channel between source and destination. Outage performance of relay based system can be improved through proper allocation of power and positioning of relay node. Analytical expression for outage probability for the opportunistic relaying scheme under consideration has been derived and its performance has been compared with an equivalent SIMO system performing selection combining. Results shows that opportunistic relaying outperform single-hop SIMO in high path-loss condition and performance of relay based system can further be improved by proper power allocation and relay positioning. The work presented in this paper is expected to be useful for the deployment of relay based system in various channel conditions.
Keywords :
Rayleigh channels; diversity reception; telecommunication network reliability; wireless channels; Rayleigh fading; channel condition; cooperative relaying; coverage area; dual-hop opportunistic relaying; high path-loss condition; outage performance; power allocation; relay node positioning; selection combining; single-hop SIMO; transmission reliability; virtual arrays; Antenna arrays; Bit error rate; Diversity reception; Fading; Performance analysis; Power system relaying; Power system reliability; Protocols; Rayleigh channels; Relays; Outage probability; Rayleigh fading channels; dual-hop opportunistic relaying; regenerative relaying; single-hop SIMO;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications (NCC), 2010 National Conference on
Conference_Location :
Chennai
Print_ISBN :
978-1-4244-6383-1
Type :
conf
DOI :
10.1109/NCC.2010.5430225
Filename :
5430225
Link To Document :
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