• DocumentCode
    1836418
  • Title

    Large Signal 2nd Harmonic on Wafer Mesfet Characterization

  • Author

    Ferrero, Andrea ; Pisani, Umberto

  • Author_Institution
    Dipartimento di Elettronica, Politecnico di Torino, Cs. Duca degli Abruzzi 24, TORINO, ITALY
  • Volume
    18
  • fYear
    1990
  • fDate
    Nov. 1990
  • Firstpage
    101
  • Lastpage
    106
  • Abstract
    An automatic test set which performs a real time harmonic load-pull characterization is proposed. An active load technique is used in order to set the load at the test frequency and its harmonics and a complete set of device parameters useful for power amplifier design purposes can be measured versus the harmonic loads. The calibration procedure, based on substrate and coaxial standards, has been mainly developed for on wafer measurement in order to set the reference planes directly on the DUT.
  • Keywords
    Automatic testing; Calibration; Coaxial components; Frequency measurement; MESFETs; Measurement standards; Performance evaluation; Power amplifiers; Power measurement; Power system harmonics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 36th
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1990.324001
  • Filename
    4119573
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1836418