Title :
Liquid cooling performance for a 3-dimensional multichip module and miniature heat sink
Author :
Vogel, Marlin R.
Author_Institution :
Sun Microsyst. Comput. Corp., Milpitas, CA, USA
Abstract :
Measured thermal performance is presented for a single phase liquid-cooled module. Tape automated bonded (TAB) thermal test chips and their associated substrates are stacked in a compact, 3-dimensional liquid tight module. A dielectric liquid, polyalphaolefin (PAO) is forced to flow past the active and inactive sides of the TAB chips. At a volumetric flowrate of 0.05 gallons per minute (gpm) and an estimated pressure loss less than 0.5 psi. the measured junction-to-liquid thermal resistance is 2.0 C/W for a 0.50"×0.50"×0.015" thermal test chip. The thermal resistance was also measured for an indirect liquid cooling approach. PAO was used to cool a miniature sink mounted directly to a 0.50"×0.50" heat source. The heat source was used to simulate the thermal characteristics of a chip carrier package. Overall dimensions of the liquid heat sink measured 1.0"×1.0"×0.28". The measured junction-to-liquid thermal resistance is 0.52 C/W for a flowrate of 0.05 gpm. and for an estimated pressure loss less than 1.0 psi. Numerical computational techniques yielded results which were comparable to the measured thermal resistances for both the 3-dimensional module and the miniature heat sink. Enhanced thermal performance gained by introducing micro encapsulated phase change material to the PAO is estimated for both the 3-dimensional module and the miniature heat sink
Keywords :
cooling; heat sinks; multichip modules; tape automated bonding; thermal resistance; 3-dimensional MCM; 3D liquid tight module; 3D multichip module; TAB thermal test chips; chip carrier package; dielectric liquid; indirect liquid cooling; liquid cooling performance; liquid heat sink; micro encapsulated phase change material; miniature heat sink; polyalphaolefin; single phase liquid-cooled module; tape automated bonded chips; thermal performance; thermal resistance; Dielectric loss measurement; Dielectric measurements; Electrical resistance measurement; Heat sinks; Liquid cooling; Loss measurement; Multichip modules; Pressure measurement; Semiconductor device measurement; Thermal resistance;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1994. SEMI-THERM X., Proceedings of 1994 IEEE/CPMT 10th
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-1852-8
DOI :
10.1109/STHERM.1994.288991