• DocumentCode
    1836754
  • Title

    Tacky DotsTM transfer of solder spheres for flip chip and electronic package applications

  • Author

    Hotchkiss, Greg ; Amador, Gonzalo ; Jacobs, Liz ; Stierman, Roger ; Dunford, Steve ; Hundt, Paul ; Beikmohamadi, A. ; Cairncross, Allan ; Gantzhorn, John ; Quinn, Brian ; Saltzberg, Michael

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1998
  • fDate
    25-28 May 1998
  • Firstpage
    434
  • Lastpage
    441
  • Abstract
    The use of preformed solder spheres for bumping flip chip wafers has not gained wide acceptance within the semiconductor industry. Due in part to equipment shortcomings, solder sphere transfer until now was commonly limited to spheres 300 μm or larger, much too large for the typical flip chip applications of 150 μm or less. To address this need, Texas Instruments and DuPontB have jointly developed a process for transferring 127 μm diameter solder spheres to wafers. The process, called Tacky DotsTM, forms are array of sticky or tacky dots in a photoimageable adhesive coating. Solder spheres sprinkled on the adhesive coating are then captured and retained by the tacky dots until the spheres are aligned and reflowed to the wafer. This paper describes the equipment and processes developed for bumping wafers using Tacky DotsTM. The compliant polyimide sheet used in Tacky DotsTM required a new and unique equipment design that aligns the solder spheres to the wafer and then reflows the solder without moving the wafer. Post reflow analysis of the bumped dies before and after environmental testing is reviewed. Tests conducted with a leadless chip carrier package design are also reviewed to demonstrate the capability of Tacky DotsTM at transferring spheres to electronic packages and substrates other than wafers
  • Keywords
    circuit reliability; failure analysis; flip-chip devices; integrated circuit packaging; microassembling; reflow soldering; 127 micron; DuPontB; Tacky Dots transfer; Texas Instruments; compliant polyimide sheet; electronic package applications; equipment design; flip chip applications; leadless chip carrier package design; photoimageable adhesive coating; preformed solder spheres; solder reflow; wafer bumping; Coatings; Electronic equipment testing; Electronics industry; Electronics packaging; Flip chip; Instruments; Lead; Packaging machines; Polyimides; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 1998. 48th IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-4526-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1998.678730
  • Filename
    678730