Title :
Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)
Abstract :
The following topics were dealt with: thermal characterization; thermal management; thermal modeling
Keywords :
cooling; integrated circuit technology; packaging; semiconductor technology; thermal analysis; SEMITHERM; semiconductor devices; thermal characterization; thermal management; thermal modeling;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1994. SEMI-THERM X., Proceedings of 1994 IEEE/CPMT 10th
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-1852-8
DOI :
10.1109/STHERM.1994.289001
