Title :
Automated On-Wafer Noise and Load Pull Characterization Using Precision Computer Controlled Electromechanical Tuners
Author :
Tutt, Marcel N. ; Pavlidis, Dimitris ; Tsironis, Christos
Author_Institution :
Solid-state Electronics Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122
Abstract :
A wafer probing system capable of both noise, and load and source pull measurements is described. The system is based on precision computer controlled electromechanical tuners. Sophisticated system software controls calibration, measurements, data analysis and display. Results of measurements of submicron In-GaAs/InAlAs/InP HEMTs and GaAs MESFETs are presented.
Keywords :
Automatic control; Calibration; Computer displays; Control systems; Data analysis; Indium compounds; Noise measurement; Software measurement; System software; Tuners;
Conference_Titel :
ARFTG Conference Digest-Spring, 37th
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1991.324021
