Title :
Thin-slot formalism for the FDTD analysis of shielding effectiveness
Author :
Run, Xiong ; Bin, Chen ; Qin, Yin ; Bihua, Zhou
Author_Institution :
LEMP Lab., PLA Univ. of Sci. &Tech., Nanjing, China
Abstract :
In many electrical and electronic systems, metallic enclosures are used to provide electromagnetic shielding. These enclosures normally contain thin wires, thin slots, and frequency-selective slots that degrade the shielding effects. The capacitance thin-slot formalism (C-TSF) by [2] has been around for quite some time in the finite-difference time-domain analysis (FDTD) of thin-slot penetration. An improved CTSF (I-TSF) has been proposed using the conformal mapping technique in [3]. The TSFs is used in the analysis of shielding effectiveness (SE), and it is verified that I-TSF gives a better result than C-TSF in Shielding Effectiveness analysis.
Keywords :
electromagnetic shielding; finite difference time-domain analysis; C-TSF; FDTD analysis; capacitance thin-slot formalism; conformal mapping technique; electromagnetic shielding; finite-difference time-domain analysis; frequency-selective slots; metallic enclosure; shielding effectiveness analysis; thin wires; Apertures; Capacitance; Computational modeling; Electric fields; Finite difference methods; Magnetic fields; Time domain analysis; C-TSF; FDTD; I-TSF; TSF; shielding effectiveness;
Conference_Titel :
Microwave Technology & Computational Electromagnetics (ICMTCE), 2011 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8556-7
DOI :
10.1109/ICMTCE.2011.5915555
