• DocumentCode
    183723
  • Title

    A true-RMS integrated power sensor for on-chip calibration

  • Author

    Wursthorn, Jonas ; Knapp, Herbert ; Aufinger, Klaus ; Lachner, Rudolf ; Al-Eryani, Jidan ; Maurer, Linus

  • Author_Institution
    Infineon Technol. AG, Neubiberg, Germany
  • fYear
    2014
  • fDate
    Sept. 28 2014-Oct. 1 2014
  • Firstpage
    13
  • Lastpage
    16
  • Abstract
    An on-chip RF power sensor based on the bolometer principle is presented in this work. The sensor can be used for transmitter calibration purposes without using any RF equipment offering time and cost savings. Investigations on various layers of the fT=170GHz SiGe bipolar technology, which is used in this work, are performed and evaluated. Especially silicided polysilicon layers show a promising behavior as bolometer. Measurements on a 76GHz transmitter chip are performed to point out the feasibility of the on-chip absolute RF power sensor. The results show that this novel sensor concept is well suited for on-chip self-calibration.
  • Keywords
    Ge-Si alloys; bolometers; radiofrequency integrated circuits; SiGe; SiGe bipolar technology; bolometer principle; frequency 170 GHz; frequency 76 GHz; on-chip RF power sensor; on-chip calibration; on-chip self-calibration; silicided polysilicon layers; transmitter calibration; transmitter chip; true-RMS integrated power sensor; Calibration; Detectors; Power measurement; Radio frequency; Resistance; Resistors; Transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2014 IEEE
  • Conference_Location
    Coronado, CA
  • Type

    conf

  • DOI
    10.1109/BCTM.2014.6981276
  • Filename
    6981276