• DocumentCode
    1837625
  • Title

    Application of quasi-static method of moments for the design of OC-192 and OC-768 fiber optic integrated circuits

  • Author

    Huang, C.-W.P. ; Jian-Wen Bao ; Dwarakanath, N. ; Al-Kuran, S.

  • Author_Institution
    Anadigics Inc., Warren, NJ, USA
  • fYear
    2002
  • fDate
    3-4 June 2002
  • Firstpage
    97
  • Lastpage
    100
  • Abstract
    A novel global layout modeling technique based on a quasi-static method of moments (MoM) analysis for the design of 10 and 40 Gbit/sec fiber optic integrated circuits is presented. Theory of the quasi-static MoM technique is reviewed and validated for millimeter wave applications. This technique enables rigorous circuit/layout co-simulation with minimum computational resources compared with traditional electromagnetic solvers. Excellent agreement between simulated and measured results is found in both time and frequency domains.
  • Keywords
    S-parameters; circuit layout CAD; electric field integral equations; method of moments; microwave photonics; millimetre wave integrated circuits; optical communication equipment; optical fibre amplifiers; telecommunication computing; 10 Gbit/s; 40 Gbit/s; S-parameters; broadband amplifier; coplanar waveguides; eye diagram; fiber optic amplifier; fiber optic integrated circuits; frequency domain; global layout modeling technique; millimeter wave applications; minimum computational resources; mixed potential integral equations; model partitioning analysis; quasistatic method of moments; rigorous circuit/layout cosimulation; time domain; traveling wave amplifiers; vertical bipolar inter-company transistor model; Computational modeling; Integrated circuit layout; Integrated circuit modeling; Millimeter wave integrated circuits; Millimeter wave measurements; Millimeter wave technology; Moment methods; Optical design; Optical fibers; Photonic integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    1529-2517
  • Print_ISBN
    0-7803-7246-8
  • Type

    conf

  • DOI
    10.1109/RFIC.2002.1011932
  • Filename
    1011932