DocumentCode
1837771
Title
Measurement Set-Up for High-Frequency Characterization of Planar Contact Devices
Author
Degraeuwe, Peter ; Martens, Luc ; De Zutter, Daniël
Author_Institution
Laboratory of Electromagnetism and Acoustics (LEA), University of Gent, Sint-Pietersnieuwstraat 41, B-9000 Gent, Belgium, Tel.: ++(32)91/64.33.16, Fax: ++(32)91/64.35.93
Volume
21
fYear
1992
fDate
33756
Firstpage
19
Lastpage
25
Abstract
A new measurement system using coplanar probe heads has been built in order to perform accurate frequency and time domain measurements on large structures with non-coaxial planar contacts, such as interconnections on PCBs, connectors and multichip modules. The advantages of the system are illustrated by measurements on microstrip lines on a FR4-PCB.
Keywords
Acoustic measurements; Coaxial cables; Coaxial components; Frequency measurement; Integrated circuit interconnections; Packaging; Performance evaluation; Probes; Testing; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 39th
Conference_Location
Albuquerque, NM, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1992.326969
Filename
4119634
Link To Document