DocumentCode
1837934
Title
Compendia of TID and SEE test results of integrated circuits
Author
Layton, Phil ; Williamson, Gale ; Gilbert, Charlie ; Longden, Larry ; Patnaude, Ed ; Sloan, Clancy
Author_Institution
Maxwell Technol., Inc., San Diego, CA, USA
fYear
2004
fDate
22-22 July 2004
Firstpage
6
Lastpage
9
Abstract
Single event effects (SEE) and total ionizing dose (TID) data taken for existing and potential space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.
Keywords
integrated circuit testing; radiation effects; space vehicle electronics; SEE; TID; heavy ions; integrated circuit radiation testing; radiation effects; single event effects; single event latchup threshold levels; single event upset threshold levels; space products; space radiation environment; total ionizing dose; Circuit testing; Cyclotrons; Integrated circuit technology; Integrated circuit testing; Performance evaluation; Production; Radiation effects; Single event upset; Space technology; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-8697-3
Type
conf
DOI
10.1109/REDW.2004.1352896
Filename
1352896
Link To Document