Title :
Compendia of TID and SEE test results of integrated circuits
Author :
Layton, Phil ; Williamson, Gale ; Gilbert, Charlie ; Longden, Larry ; Patnaude, Ed ; Sloan, Clancy
Author_Institution :
Maxwell Technol., Inc., San Diego, CA, USA
Abstract :
Single event effects (SEE) and total ionizing dose (TID) data taken for existing and potential space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.
Keywords :
integrated circuit testing; radiation effects; space vehicle electronics; SEE; TID; heavy ions; integrated circuit radiation testing; radiation effects; single event effects; single event latchup threshold levels; single event upset threshold levels; space products; space radiation environment; total ionizing dose; Circuit testing; Cyclotrons; Integrated circuit technology; Integrated circuit testing; Performance evaluation; Production; Radiation effects; Single event upset; Space technology; Switches;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352896
