DocumentCode
1837961
Title
Current single event effects results for candidate spacecraft electronics for NASA
Author
Bryan, Martha V O ; Seidleck, Christina M. ; Carts, Martin A. ; Howard, James W., Jr. ; Kim, Hak S. ; Forney, James D. ; LaBel, Kenneth A. ; Marshall, C.J. ; Reed, Robert A. ; Sanders, Anthony B. ; Hawkins, D.K. ; Cox, S.R. ; Buchner, Stephen P. ; Oldham,
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fYear
2004
fDate
22-22 July 2004
Firstpage
10
Lastpage
18
Abstract
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others.
Keywords
integrated circuit testing; ion beam effects; proton effects; semiconductor device testing; space vehicle electronics; analog IC; digital IC; electronics radiation vulnerability; heavy ion induced effects; hybrid devices; linear bipolar devices; proton induced effects; single event effects; spacecraft electronics; Aerospace electronics; Cyclotrons; Laboratories; NASA; Performance evaluation; Protons; Radiation effects; Space vehicles; Testing; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-8697-3
Type
conf
DOI
10.1109/REDW.2004.1352897
Filename
1352897
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