Title :
Current single event effects results for candidate spacecraft electronics for NASA
Author :
Bryan, Martha V O ; Seidleck, Christina M. ; Carts, Martin A. ; Howard, James W., Jr. ; Kim, Hak S. ; Forney, James D. ; LaBel, Kenneth A. ; Marshall, C.J. ; Reed, Robert A. ; Sanders, Anthony B. ; Hawkins, D.K. ; Cox, S.R. ; Buchner, Stephen P. ; Oldham,
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others.
Keywords :
integrated circuit testing; ion beam effects; proton effects; semiconductor device testing; space vehicle electronics; analog IC; digital IC; electronics radiation vulnerability; heavy ion induced effects; hybrid devices; linear bipolar devices; proton induced effects; single event effects; spacecraft electronics; Aerospace electronics; Cyclotrons; Laboratories; NASA; Performance evaluation; Protons; Radiation effects; Space vehicles; Testing; USA Councils;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352897
