Title :
Current total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA
Author :
Cochran, Donna J. ; Buchner, Stephen P. ; Irwin, Tim L. ; Kniffin, Scott D. ; Ladbury, Raymond L. ; Palor, Christopher D. ; LaBel, Kenneth A. ; Marshall, Cheryl J. ; Reed, Robert A. ; Sanders, Anthony B. ; Hawkins, Donald K. ; Flanigan, Ryan J. ; Cox, Ste
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include optoelectronics, digital, analog, linear bipolar devices, hybrid devices, analog-to-digital converters (ADCs), and digital-to-analog converters (DACs), among others.
Keywords :
integrated circuit testing; proton effects; semiconductor device testing; space vehicle electronics; ADC; DAC; TID; analog IC; analog-to-digital converters; digital IC; digital-to-analog converters; displacement damage; hybrid devices; linear bipolar devices; optoelectronics; proton damage testing; spacecraft electronics radiation vulnerability; total ionizing dose; Aerospace electronics; Cyclotrons; NASA; Performance evaluation; Protons; Radiation effects; Space vehicles; Test facilities; Testing; USA Councils;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352898
