Title :
A wide tuning triple-band frequency generator MMIC in 0.18μm SiGe BiCMOS technology
Author :
Hechen Wang ; Feng Zhao ; Dai, Fa Foster ; Guofu Niu ; Wilamowski, Bogdan ; Jun Fu ; Wei Zhou ; Yudong Wang
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
fDate :
Sept. 28 2014-Oct. 1 2014
Abstract :
This paper presents a wide-tuning frequency generation scheme based on bottom-series coupled quadrature VCO (QVCO). The low band and middle band frequency signal is generated from the QVCO while the high band signal is obtained from a gilbert mixer. The tuning-range enhancement technique allows a three band frequency generation in the range from 2.4GHz to 8.4GHz without penalizing its phase noise. The VCO monolithic microwave integrated circuit (MMIC) is implemented in a 0.18 μm SiGe BiCMOS technology with 1.8 mm2 area. The measured frequency range is 15.4% for the three bands centered at 2.5GHz, 5GHz, and 7.5GHz. The measured phase noise are -124.4dBc/Hz, -119.1dBc/Hz and -108.8dBc/Hz at 1 MHz offset for the low, middle, high band signals, separately. The measurement results demonstrate that proposed frequency generation technique can achieve wide tuning range capability as well as the low phase noise with very compact circuit.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; MMIC; phase noise; tuning; voltage-controlled oscillators; SiGe; SiGe BiCMOS technology; VCO monolithic microwave integrated circuit; bottom-series coupled quadrature VCO; frequency 2.4 GHz to 8.4 GHz; frequency generation technique; frequency signal; gilbert mixer; phase noise; size 0.18 mum; size 1.8 mm; three band frequency generation; tuning-range enhancement technique; wide tuning triple-band frequency generator MMIC; wide-tuning frequency generation scheme; Frequency measurement; Noise measurement; Phase measurement; Phase noise; Tuning; Voltage-controlled oscillators; Gilbert mixer; RF; frequency doubler; phase noise; quadrature VCO; tripler; tuning range; voltage-controlled oscillator;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2014 IEEE
Conference_Location :
Coronado, CA
DOI :
10.1109/BCTM.2014.6981314