DocumentCode
1838033
Title
Radiation lot acceptance testing (RLAT) at high and low dose rates with neutron pre-dosing [microcircuits]
Author
Posey, Barry A. ; Renfrow, Steven ; Davis, Matthew ; Steinbach, Robert ; Morgan, Daniel
Author_Institution
ATK Mission Res., Huntsville, AL, USA
fYear
2004
fDate
22-22 July 2004
Firstpage
32
Lastpage
35
Abstract
We present results of radiation lot acceptance testing (RLAT) on microcircuits exposed to neutron flux prior to total ionizing dose (TID) exposure. RLAT was performed at high dose rate with anneal and low dose rate radiation levels.
Keywords
annealing; gamma-ray effects; integrated circuit testing; neutron effects; ELDRS; RLAT; TID exposure; annealing; enhanced low dose rate sensitivity; gamma irradiation; high dose testing rate; low dose testing rate; microcircuits; neutron flux exposure; neutron pre-dosing; radiation lot acceptance testing; total ionizing dose; Analog integrated circuits; Annealing; Automatic testing; BiCMOS integrated circuits; Bipolar integrated circuits; Circuit testing; Electronic equipment testing; Neutrons; Performance evaluation; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-8697-3
Type
conf
DOI
10.1109/REDW.2004.1352900
Filename
1352900
Link To Document