Title :
Radiation lot acceptance testing (RLAT) at high and low dose rates with neutron pre-dosing [microcircuits]
Author :
Posey, Barry A. ; Renfrow, Steven ; Davis, Matthew ; Steinbach, Robert ; Morgan, Daniel
Author_Institution :
ATK Mission Res., Huntsville, AL, USA
Abstract :
We present results of radiation lot acceptance testing (RLAT) on microcircuits exposed to neutron flux prior to total ionizing dose (TID) exposure. RLAT was performed at high dose rate with anneal and low dose rate radiation levels.
Keywords :
annealing; gamma-ray effects; integrated circuit testing; neutron effects; ELDRS; RLAT; TID exposure; annealing; enhanced low dose rate sensitivity; gamma irradiation; high dose testing rate; low dose testing rate; microcircuits; neutron flux exposure; neutron pre-dosing; radiation lot acceptance testing; total ionizing dose; Analog integrated circuits; Annealing; Automatic testing; BiCMOS integrated circuits; Bipolar integrated circuits; Circuit testing; Electronic equipment testing; Neutrons; Performance evaluation; Software testing;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352900
