Effect of passivation on the enhanced low dose rate sensitivity of National LM124 operational amplifiers

Author

Seiler, JohnE ; Platteter, Dale G. ; Dunham, Gary W. ; Pease, Ronald L. ; Maher, Mike C. ; Shaneyfelt, Marty R.

Author_Institution

NAVSEA Crane, IN, USA

fYear

2004

fDate

22-22 July 2004

Firstpage

42

Lastpage

46

Abstract

This work presents high and low dose rate test results for LM124 operational amplifiers that were fabricated with six passivation layer types. Consistent with previous data, these results confirm that passivation layers play a significant role in determining ELDRS response. SIMS analysis suggests that an influential factor in determining the high and low dose rate response may be the location and concentration of hydrogen at the Si-SiO₂ interface and in the passivation layers.

Keywords

integrated circuit testing; operational amplifiers; passivation; radiation effects; secondary ion mass spectroscopy; ELDRS response; H/sub 2/; LM124 operational amplifiers; SIMS analysis; Si-SiO/sub 2/; dose rate enhancement factor; enhanced low dose rate sensitivity; high dose rate testing; low dose rate testing; passivation effects; passivation layer type; total dose irradiation; Cranes; Hydrogen; Laboratories; Mass spectroscopy; Metallization; Operational amplifiers; Packaging; Passivation; Testing; US Department of Energy;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2004 IEEE

Conference_Location

Atlanta, GA, USA

Print_ISBN

0-7803-8697-3

Type

conf

DOI

10.1109/REDW.2004.1352902

Filename

1352902