Title :
Effect of passivation on the enhanced low dose rate sensitivity of National LM124 operational amplifiers
Author :
Seiler, JohnE ; Platteter, Dale G. ; Dunham, Gary W. ; Pease, Ronald L. ; Maher, Mike C. ; Shaneyfelt, Marty R.
Author_Institution :
NAVSEA Crane, IN, USA
Abstract :
This work presents high and low dose rate test results for LM124 operational amplifiers that were fabricated with six passivation layer types. Consistent with previous data, these results confirm that passivation layers play a significant role in determining ELDRS response. SIMS analysis suggests that an influential factor in determining the high and low dose rate response may be the location and concentration of hydrogen at the Si-SiO 2 interface and in the passivation layers.
Keywords :
integrated circuit testing; operational amplifiers; passivation; radiation effects; secondary ion mass spectroscopy; ELDRS response; H/sub 2/; LM124 operational amplifiers; SIMS analysis; Si-SiO/sub 2/; dose rate enhancement factor; enhanced low dose rate sensitivity; high dose rate testing; low dose rate testing; passivation effects; passivation layer type; total dose irradiation; Cranes; Hydrogen; Laboratories; Mass spectroscopy; Metallization; Operational amplifiers; Packaging; Passivation; Testing; US Department of Energy;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352902
