Title :
3D Modeling from Uncalibrated Color Images for a Complete Wound Assessment Tool
Author :
Albouy, B. ; Lucas, Y. ; Treuillet, S.
Author_Institution :
Univ. of Clermont-Ferrand, Le Puy-en-Velay
Abstract :
This paper is concerned with the 3D modeling of skin wound using uncalibrated vision techniques for the volumetric assessment of the healing process. We have developed an original approach for matching two color images captured with a free-handled digital camera and generate a semi-dense 3D model. We evaluate the precision of the inferred 3D model by registration to a ground truth on artificial wounds. The method is then applied to volumetric measurements. The clinician requirements of a global 5% precision are overshot as 3% is obtained locally. The best configuration for taking photos lies between 1.2 and 1.5 for distance ratios and between 15deg and 30deg for vergence of the stereo pair. This work is part of the ESCALE project dedicated to the design of a complete 3D and color wound assessment tool using a simple free handled digital camera: a smart solution for massive diffusion in care centers as such very low cost system should be operated directly by nurses.
Keywords :
image colour analysis; image matching; patient treatment; photographic applications; skin; wounds; 3D modeling; ESCALE project; color image matching; complete wound assessment tool; medical photography; skin wound; uncalibrated color images; volumetric assessment; wound healing; Area measurement; Color; Digital cameras; Distortion measurement; Image analysis; Image processing; Prototypes; Skin; Volume measurement; Wounds; Algorithms; Color; Colorimetry; Computer Graphics; Computer Simulation; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Models, Biological; Photogrammetry; Reproducibility of Results; Sensitivity and Specificity; Software; User-Computer Interface; Wounds and Injuries;
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
Print_ISBN :
978-1-4244-0787-3
DOI :
10.1109/IEMBS.2007.4353041