• DocumentCode
    1838075
  • Title

    In-flight observations of long-term single event effect (SEE) performance on X-ray Timing Explorer (XTE) solid-state recorders (SSRs) [SRAM]

  • Author

    Poivey, Christian ; Gee, George ; LaBel, Kenneth A. ; Barth, Janet L.

  • Author_Institution
    SGT, Inc., NASA Goddard Space Flight Center, Greenbelt, MD, USA
  • fYear
    2004
  • fDate
    22-22 July 2004
  • Firstpage
    54
  • Lastpage
    57
  • Abstract
    We present multi-year single event upset (SEU) flight data on solid state recorder (SSR) memories for the X-ray Timing Explorer (XTE) NASA mission. Actual SEU rates are compared to the predicted rates, based on ground test data and environment models.
  • Keywords
    SRAM chips; radiation effects; space vehicle electronics; 140 Mbit; 40 bit; SEU in-flight data; SEU rates; SRAM; SSR; X-ray Timing Explorer; X-ray source variability measurement; XTE; in-flight SEE observations; memory devices; single event effects; single event upset; solar activity; solid-state memories; solid-state recorder memories; Error correction codes; NASA; Predictive models; Protons; Radiation effects; Single event upset; Solid state circuits; Space vehicles; Testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2004 IEEE
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-8697-3
  • Type

    conf

  • DOI
    10.1109/REDW.2004.1352904
  • Filename
    1352904
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1838075