Title :
In-flight observations of long-term single event effect (SEE) performance on X-ray Timing Explorer (XTE) solid-state recorders (SSRs) [SRAM]
Author :
Poivey, Christian ; Gee, George ; LaBel, Kenneth A. ; Barth, Janet L.
Author_Institution :
SGT, Inc., NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We present multi-year single event upset (SEU) flight data on solid state recorder (SSR) memories for the X-ray Timing Explorer (XTE) NASA mission. Actual SEU rates are compared to the predicted rates, based on ground test data and environment models.
Keywords :
SRAM chips; radiation effects; space vehicle electronics; 140 Mbit; 40 bit; SEU in-flight data; SEU rates; SRAM; SSR; X-ray Timing Explorer; X-ray source variability measurement; XTE; in-flight SEE observations; memory devices; single event effects; single event upset; solar activity; solid-state memories; solid-state recorder memories; Error correction codes; NASA; Predictive models; Protons; Radiation effects; Single event upset; Solid state circuits; Space vehicles; Testing; Timing;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352904
