DocumentCode :
1838094
Title :
Accuracy Considerations in Internal Node Timing Measurements of High-Performance MCMs
Author :
Gleason, Reed ; Smith, Ken
Author_Institution :
Cascade Microtech, 14255 SW Brigadoon Ct., Beaverton OR 97005, Phone (503) 626-8245 FAX (503) 626-6023
Volume :
22
fYear :
1992
fDate :
Dec. 1992
Firstpage :
20
Lastpage :
25
Abstract :
In order to take full advantage of MCM technology, it is desirable to push clock rates to the highest rate achievable. It is extremely important to accurately characterize parameters such as timing margins and undershoot conditions to pursue this goal. Probing internal nodes of MCMs is essential to optimizing their performance. This paper investigates the accuracy of signal acquisition under varying probe conditions. The effect of probe parasitic capacitance and inductance on timing measurements is measured and modeled.
Keywords :
Bandwidth; Capacitance measurement; Circuit testing; Clocks; Electric variables measurement; Inductance measurement; Probes; System testing; Timing; Velocity measurement; Accuracy; High speed; MCM; Measurement; Probe;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Fall, 40th
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1992.326995
Filename :
4119653
Link To Document :
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