DocumentCode
1838106
Title
A High Speed Eye Tracking System with Robust Pupil Center Estimation Algorithm
Author
Xindian Long ; Tonguz, O.K. ; Kiderman, A.
Author_Institution
Carnegie Mellon Univ., Pittsburgh
fYear
2007
fDate
22-26 Aug. 2007
Firstpage
3331
Lastpage
3334
Abstract
This paper presents a new high-speed head- mounted binocular eye position measurement system using infrared lighting and image processing technology. Current eye tracking systems either run on-line at a lower speed, do the processing off-line, or use dedicated hardware to reach high on-line processing rates. The eye position measurement system we developed only uses a general-purpose computing system and off-the-shelf imaging devices. The binocular system can provide on-line horizontal and vertical measurement at a speed of 150 Hz on a desktop system with a 3 GHz Pentium processor. We report a novel dual-mode software system and a two-step processing algorithm to increase the processing rate. A symmetric mass center algorithm is designed to provide more accurate measurements when the pupil area is partially occluded. Using synthetic eye images, we show that our algorithm performs consistently better than some of the widely used algorithms in industry.
Keywords
eye; medical computing; medical image processing; position measurement; binocular system; head-mounted binocular eye position measurement; high speed eye tracking system; image processing; infrared lighting; robust pupil center estimation algorithm; Algorithm design and analysis; Hardware; Image processing; Infrared imaging; Optical imaging; Position measurement; Robustness; Software algorithms; Software systems; Velocity measurement; Algorithms; Equipment Design; Equipment Failure Analysis; Eye Movements; Humans; Image Interpretation, Computer-Assisted; Ophthalmoscopes; Ophthalmoscopy; Pupil; Reproducibility of Results; Sensitivity and Specificity;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location
Lyon
ISSN
1557-170X
Print_ISBN
978-1-4244-0787-3
Type
conf
DOI
10.1109/IEMBS.2007.4353043
Filename
4353043
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