DocumentCode :
1838156
Title :
Temperature dependence of complex permittivity for polyimide film used in flexible printed circuit in microwave band
Author :
Tsuchiya, A. ; Sugama, H. ; Hidaka, N. ; Miyamoto, K. ; Tsujino, S. ; Hashimoto, O.
Author_Institution :
Kanagawa Ind. Technol. Center, Ebina, Japan
fYear :
2011
fDate :
12-16 Sept. 2011
Firstpage :
417
Lastpage :
420
Abstract :
Temperature dependence of the complex permittivity for polyimide (PI) used in flexible printed circuit at 10 GHz was measured by cylindrical cavity resonator method with temperature controller in temperature range between 27 to 100°C. The complex permittivity of PI absorbing moisture was larger than those of PI drying at 27°C. With an increase in temperature, the complex permittivity of PI absorbing moisture decreased and came close to those of PI drying over 70°C. The complex permittivity of PI in low temperature is affected by moisture absorption compared to high temperature. From measurement result, we discussed the effect of temperature and moisture condition on dielectric loss of microstrip line fabricated on PI.
Keywords :
cavity resonators; dielectric losses; dielectric materials; dielectric thin films; flexible electronics; microstrip lines; permittivity; polymer films; printed circuits; cylindrical cavity resonator; dielectric loss; flexible printed circuit; frequency 10 GHz; microstrip line; moisture absorption; polyimide film; temperature 100 degC to 27 degC; temperature dependent complex permittivity; Dielectric losses; Moisture; Permittivity; Permittivity measurement; Temperature dependence; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2011 International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-61284-976-8
Type :
conf
DOI :
10.1109/ICEAA.2011.6046375
Filename :
6046375
Link To Document :
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