• DocumentCode
    1838224
  • Title

    Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation

  • Author

    Hiemstra, David M. ; Chayab, Fayez ; Szajek, Lucas

  • Author_Institution
    MDRobotics, Brampton, Ont., Canada
  • fYear
    2004
  • fDate
    22-22 July 2004
  • Firstpage
    79
  • Lastpage
    84
  • Abstract
    The proton induced SEU cross-sections of dynamic test designs implemented on Xilinx´s Virtex-II and Spartan-3 FPGAs are presented. The cross-sections are used to estimate upset rates in the space radiation environment.
  • Keywords
    field programmable gate arrays; integrated circuit reliability; integrated circuit testing; proton effects; space vehicle electronics; SEE; SRAM FPGA; dynamic single event upset characterization; field programmable gate arrays; proton induced SEU cross-sections; proton irradiation; space radiation environment; upset rates; Circuit testing; Field programmable gate arrays; Hardware; Logic devices; Logic testing; Protons; Random access memory; Single event upset; Telephony; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2004 IEEE
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-8697-3
  • Type

    conf

  • DOI
    10.1109/REDW.2004.1352909
  • Filename
    1352909
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1838224