Title :
Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation
Author :
Hiemstra, David M. ; Chayab, Fayez ; Szajek, Lucas
Author_Institution :
MDRobotics, Brampton, Ont., Canada
Abstract :
The proton induced SEU cross-sections of dynamic test designs implemented on Xilinx´s Virtex-II and Spartan-3 FPGAs are presented. The cross-sections are used to estimate upset rates in the space radiation environment.
Keywords :
field programmable gate arrays; integrated circuit reliability; integrated circuit testing; proton effects; space vehicle electronics; SEE; SRAM FPGA; dynamic single event upset characterization; field programmable gate arrays; proton induced SEU cross-sections; proton irradiation; space radiation environment; upset rates; Circuit testing; Field programmable gate arrays; Hardware; Logic devices; Logic testing; Protons; Random access memory; Single event upset; Telephony; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352909
