Title :
Interconnection Transmission Line Parameter Characterization
Author :
Marks, Roger B. ; Williams, Dylan F.
Author_Institution :
National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80303
Abstract :
This paper introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.
Keywords :
Capacitance; Coplanar transmission lines; Coplanar waveguides; Dielectric losses; Dielectric substrates; Dispersion; Inductance; Propagation losses; Silicon; Transmission lines;
Conference_Titel :
ARFTG Conference Digest-Fall, 40th
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1992.327004
