• DocumentCode
    1838282
  • Title

    Noise model, analysis and characterization of a differential active pixel sensor

  • Author

    Sander, David ; Nelson, Nicole ; Abshire, Pamela

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    1780
  • Lastpage
    1783
  • Abstract
    We report the design, analytical model and experimental noise performance from a photo sensor fabricated in a 0.5 mum commercial CMOS process. The sensor is a novel differential active pixel sensor which performs in-pixel correlated double sampling (CDS) to reduce correlated and environmental noise at the expense of increased thermally generated noise sources such as reset and readout noise. In comparison with a representative single ended sensor, the differential sensor exhibits an increased fundamental reset and readout noise of 117% and 58% respectively.
  • Keywords
    CMOS image sensors; noise; CMOS process; correlated double sampling; differential active pixel sensor; noise analysis; noise characterization; noise model; photo sensor; representative single ended sensor; thermally generated noise sources; Active noise reduction; Fluorescence; Low-frequency noise; MOS devices; Noise generators; Photodiodes; Power supplies; Sensor phenomena and characterization; Thermal sensors; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4541784
  • Filename
    4541784