DocumentCode
1838282
Title
Noise model, analysis and characterization of a differential active pixel sensor
Author
Sander, David ; Nelson, Nicole ; Abshire, Pamela
Author_Institution
Sch. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD
fYear
2008
fDate
18-21 May 2008
Firstpage
1780
Lastpage
1783
Abstract
We report the design, analytical model and experimental noise performance from a photo sensor fabricated in a 0.5 mum commercial CMOS process. The sensor is a novel differential active pixel sensor which performs in-pixel correlated double sampling (CDS) to reduce correlated and environmental noise at the expense of increased thermally generated noise sources such as reset and readout noise. In comparison with a representative single ended sensor, the differential sensor exhibits an increased fundamental reset and readout noise of 117% and 58% respectively.
Keywords
CMOS image sensors; noise; CMOS process; correlated double sampling; differential active pixel sensor; noise analysis; noise characterization; noise model; photo sensor; representative single ended sensor; thermally generated noise sources; Active noise reduction; Fluorescence; Low-frequency noise; MOS devices; Noise generators; Photodiodes; Power supplies; Sensor phenomena and characterization; Thermal sensors; Working environment noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
978-1-4244-1683-7
Electronic_ISBN
978-1-4244-1684-4
Type
conf
DOI
10.1109/ISCAS.2008.4541784
Filename
4541784
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