Title :
TID and SEE testing results of Altera Cyclone field programmable gate array
Author :
Clark, Steven L. ; Avery, Keith ; Parker, Robert
Author_Institution :
Air Force Res. Lab., Kirtland AFB, NM, USA
Abstract :
Total ionizing dose (TID) and single event effects testing was performed on Altera Cyclone FPGAs. The devices exhibit slight performance degradation to a TID of 1 Mrad (Si), but also exhibited single event latchup at a low LET.
Keywords :
field programmable gate arrays; integrated circuit reliability; integrated circuit testing; radiation effects; 1 Mrad; FPGA; SEE testing; SEL; SEU; TID; field programmable gate array; low LET single event latchup; performance degradation; single event effects; total ionizing dose; Current supplies; Cyclic redundancy check; Cyclones; Field programmable gate arrays; Laboratories; Logic devices; Random access memory; Read-write memory; Testing; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352911
