• DocumentCode
    1838336
  • Title

    Characterization of light output from narrow sodium iodide detectors

  • Author

    Ordonez, C.E. ; Chang, W. ; Liu, J. ; Gunter, D.L.

  • Author_Institution
    Dept. of Med. Phys., Rush-Presbyterian-St. Luke´´s Med. Center, Chicago, IL, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    2-9 Nov 1996
  • Firstpage
    1234
  • Abstract
    The use of narrow scintillators in imaging devices raises the question of whether there is enough light output that can yield reasonable energy and spatial resolutions. Compared to scintillation within large-area detectors (such as those used in conventional gamma cameras), scintillation photons within narrow detectors are expected to undergo more reflections because of the proximity of the detector surfaces. In this study, we use simulation methods to estimate the light output from long, narrow sodium iodide crystals, and to investigate the effects of detector geometry and detector surface reflection properties on the fraction of scintillation photons that are able to leave the crystal through the exit window. Our simulations show that the light output from a 3.5-mm wide by 10-mm high by 300-mm long detector can result in reasonable energy resolutions. Our simulations also suggest that, in conjunction with the use of external reflectors, a crystal that has its sides polished to a smooth finish results in better light output than one with sides ground to a rough finish
  • Keywords
    gamma-ray detection; solid scintillation detectors; 10 mm; 3.5 mm; 300 mm; NaI:Tl; detector geometry; detector surface reflection properties; gamma cameras; imaging devices; large-area detectors; light output characterization; narrow NaI(Tl) detectors; simulation methods; Cameras; Gamma ray detection; Gamma ray detectors; Geometry; Optical imaging; Optical reflection; Photonic crystals; Solid modeling; Solid scintillation detectors; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-3534-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1996.591633
  • Filename
    591633