DocumentCode
1838338
Title
Frequency and Time Domain Characterization of High-Speed Digital Circuit Interconnects in a Multilayer Printed Circuit Board
Author
Agrawal, Amit P.
Author_Institution
IBM, 1701 North Street, Endicott, NY-13760
Volume
22
fYear
1992
fDate
Dec. 1992
Firstpage
104
Lastpage
127
Abstract
The digital interconnects are characterized in frequency domain by measuring the scattering matrices using network analyser. These scattering matrices are used to find frequency dependent resistance, inductance, capacitance, and conductance of the coupled transmission lines. In time domain, the lossy transmission line parameters are used to simulate the transient response to analyse the skin-effect and dielectric loss effect on the signal propagation and cross-talk.
Keywords
Dielectric losses; Digital circuits; Distributed parameter circuits; Frequency domain analysis; Integrated circuit interconnections; Nonhomogeneous media; Printed circuits; Propagation losses; Scattering; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Fall, 40th
Conference_Location
Orlando, FL, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1992.327006
Filename
4119664
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