DocumentCode :
1838435
Title :
Wafer ambient control for Agile FAB
Author :
Ito, Shoko ; Tamaoki, Makiko ; Shimazaki, Ayako ; Nadahara, Soichi ; Okumura, Katsuya ; Suzuki, Yoko ; Tanaka, Akira ; Tsujimura, Manabu
Author_Institution :
Semicond. Co., Toshiba Corp., Yokohama, Japan
fYear :
2001
fDate :
2001
Firstpage :
121
Lastpage :
124
Abstract :
The "Wafer Ambient Control Box" has been developed for minimizing the influence of chemical contaminants such as acidic gas, basic gas, organic molecules, and also humidity. It consists of a ULPA filter, chemical filters, SPE films (dehumidifier), and a fan. We applied the Box to the Al interconnection process. The acidic gas adsorbed on the wafer causes corrosion defects. By keeping the wafer in the "Wafer Ambient Control Box", Al lines were prevented from corrosion because the chemical filter trapped the acidic gas desorbed from the wafer. We also applied the humidity controlled one to the poly-Si plug process. The poly-Si/Si contact resistance was equivalent to that processed continuously even though it was kept for 67 h before poly-Si deposition
Keywords :
aluminium; filtration; flexible manufacturing systems; humidity control; impurities; integrated circuit interconnections; integrated circuit manufacture; surface contamination; Agile FAB; Al; Al interconnection process; SPE films; Si; ULPA filter; acidic gas; chemical contaminants; chemical filters; corrosion prevention; dehumidifier; fan; flexible manufacturing system; humidity; organic molecules; poly-Si plug process; poly-Si/Si contact resistance; wafer ambient control box; wafer surface; Air cleaners; Chemical processes; Contamination; Corrosion; Costs; Filters; Humidity control; Organic chemicals; Oxidation; Semiconductor films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Symposium, 2001 IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-6731-6
Type :
conf
DOI :
10.1109/ISSM.2001.962929
Filename :
962929
Link To Document :
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