Title :
X-band characterization of multi-walled carbon nanotube films
Author :
Katsounaros, A. ; Rajab, K.Z. ; Hao, Y. ; Mann, M. ; Milne, W.I.
Author_Institution :
Sch. of Electron. Eng. & Comput. Sci., Queen Mary Univ. of London, London, UK
Abstract :
A vertically aligned multi-walled carbon nanotube (VACNT) film has been characterized by rectangular waveguide measurements. The complex scattering parameters (S-parameters) are measured by a vector network analyzer at X-band frequencies. The effective complex permittivity and permeability of the VACNT film have been extracted using the Nicolson-Ross-Weir (NWR) approach. The extracted parameters are verified by full wave simulations (CST - Microwave Studio) and very good agreement has been obtained. The performance of VACNT films as an absorber is examined, and comparison with the conventional carbon loaded materials shows that a 90% size reduction is possible whilst maintaining the same absorption level.
Keywords :
carbon nanotubes; dielectric thin films; permeability; permittivity; C; Nicolson-Ross-Weir approach; VACNT film permeability; X-band characterization; X-band frequency; absorption level; complex scattering parameters; effective complex permittivity; full wave simulations; rectangular waveguide measurements; vector network analyzer; vertically aligned multiwalled carbon nanotube films; Carbon nanotubes; Films; Permeability; Permittivity; Permittivity measurement;
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2011 International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-61284-976-8
DOI :
10.1109/ICEAA.2011.6046394
