• DocumentCode
    1838672
  • Title

    An Automated Non-Linear Transistor Characterization System with a High-Level Language User-Interface for Easy Control, Visualization and Data Management

  • Author

    Ghannouchi, F.M. ; Kouki, A.B. ; Beauregard, F.

  • Author_Institution
    Microwave Research Laboratory, Ecole Polytechnique de Montreal, Montreal, Quebec, CANADA
  • Volume
    23
  • fYear
    1993
  • fDate
    34121
  • Firstpage
    18
  • Lastpage
    23
  • Abstract
    In this paper, a system for the extensive non-linear characterization of microwave transistors is presented. The high level language user interface for its automatic control and near real time visualization and management of the measured data is highlighted. Some descriptive pictures and experimental results are presented to illustrate the versatility of the system and the efficacy of the interfacing software.
  • Keywords
    Automatic control; Calibration; Control systems; Data visualization; Frequency measurement; Hardware; High level languages; Nonlinear control systems; Power measurement; Software measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 41st
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1993.327014
  • Filename
    4119683
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1838672