• DocumentCode
    1838729
  • Title

    Electromagnetic coupling effects in RFCMOS circuits

  • Author

    Adan, A.O. ; Fukumi, M. ; Higashi, K. ; Suyama, T. ; Miyamoto, M. ; Hayashi, M.

  • Author_Institution
    IC Dev. Group, Sharp Corp., Nara, Japan
  • fYear
    2002
  • fDate
    3-4 June 2002
  • Firstpage
    293
  • Lastpage
    296
  • Abstract
    The electromagnetic isolation and coupling characteristics of basic structures, namely metal pads, spiral inductors, and spiral-transistors, implemented in a core-logic CMOS process are evaluated and modeled. The models provide design guidelines on the isolation characteristics of guard-rings and shield layers for RF cross-talk suppression between circuit blocks. The importance of electromagnetic coupling to layout interconnects is demonstrated.
  • Keywords
    CMOS integrated circuits; crosstalk; electromagnetic coupling; IC design; RF CMOS circuit; RF crosstalk suppression; core-logic CMOS process; electromagnetic coupling; electromagnetic isolation; guard-ring; layout interconnect; metal pad; shield layer; spiral inductor; spiral transistor; CMOS process; Coupling circuits; Electromagnetic coupling; Electromagnetic induction; Electromagnetic modeling; Electromagnetic shielding; Guidelines; Inductors; Semiconductor device modeling; Spirals;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    1529-2517
  • Print_ISBN
    0-7803-7246-8
  • Type

    conf

  • DOI
    10.1109/RFIC.2002.1012052
  • Filename
    1012052
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1838729