Title :
Electromagnetic coupling effects in RFCMOS circuits
Author :
Adan, A.O. ; Fukumi, M. ; Higashi, K. ; Suyama, T. ; Miyamoto, M. ; Hayashi, M.
Author_Institution :
IC Dev. Group, Sharp Corp., Nara, Japan
Abstract :
The electromagnetic isolation and coupling characteristics of basic structures, namely metal pads, spiral inductors, and spiral-transistors, implemented in a core-logic CMOS process are evaluated and modeled. The models provide design guidelines on the isolation characteristics of guard-rings and shield layers for RF cross-talk suppression between circuit blocks. The importance of electromagnetic coupling to layout interconnects is demonstrated.
Keywords :
CMOS integrated circuits; crosstalk; electromagnetic coupling; IC design; RF CMOS circuit; RF crosstalk suppression; core-logic CMOS process; electromagnetic coupling; electromagnetic isolation; guard-ring; layout interconnect; metal pad; shield layer; spiral inductor; spiral transistor; CMOS process; Coupling circuits; Electromagnetic coupling; Electromagnetic induction; Electromagnetic modeling; Electromagnetic shielding; Guidelines; Inductors; Semiconductor device modeling; Spirals;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7246-8
DOI :
10.1109/RFIC.2002.1012052
