DocumentCode
1838829
Title
On The Design of New Integrated Microprobes (NIMPs) for Non-Linear On-Wafer Device Characterization
Author
Xu, Y. ; Maurin, D. ; Wu, K. ; Huyart, B. ; Klemer, D. ; Bosisio, R.G.
Author_Institution
Ecole Polytechnique de Montréal, CP 6079, succ. A, Montréal, Canada H3C 3A7
Volume
23
fYear
1993
fDate
34121
Firstpage
57
Lastpage
78
Keywords
Bandwidth; Circuit simulation; Circuit testing; Coaxial components; Coplanar waveguides; Detectors; Frequency; Gallium arsenide; MMICs; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 41st
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.1993.327020
Filename
4119689
Link To Document