• DocumentCode
    1838867
  • Title

    Multichannel Segmentation of cDNA Microarray Images using the Bayes Classifier

  • Author

    Giannakeas, N. ; Fotiadis, D.I.

  • Author_Institution
    Univ. of Ioannina, Ioannina
  • fYear
    2007
  • fDate
    22-26 Aug. 2007
  • Firstpage
    3466
  • Lastpage
    3469
  • Abstract
    Microarray technology provides a powerful tool for the quantification of the expression level for a large number of genes simultaneously. Image analysis Is a crucial step for data extraction of microarray gene expression experiments. In this paper we propose a supervised method for the segmentation of microarray Images. The Bayes classifier Is employed for a pixel by pixel classification. The proposed method classifies the pixels of the Image In two classes, foreground and background pixels. For this task, an Informative set of features Is used from both green and red channels. The method Is evaluated using a set of 5184 spots (consisting of ~15000000 pixels), from the Stanford microarray database (SMD) and the reported classification accuracy Is 82 %.
  • Keywords
    DNA; biomedical optical imaging; cellular biophysics; genetics; image classification; image segmentation; medical image processing; molecular biophysics; Bayes classifier; cDNA microarray images; data extraction; gene expression; image analysis; multichannel segmentation; Biomedical imaging; Data mining; Fluorescence; Gene expression; Image color analysis; Image databases; Image segmentation; Pixel; Shape; Spatial databases; Algorithms; Artificial Intelligence; Bayes Theorem; Gene Expression Profiling; Image Enhancement; Image Interpretation, Computer-Assisted; In Situ Hybridization, Fluorescence; Microscopy, Fluorescence; Oligonucleotide Array Sequence Analysis; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
  • Conference_Location
    Lyon
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-0787-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2007.4353077
  • Filename
    4353077