DocumentCode :
1838920
Title :
A brief history about analytic tools in medical imaging: splines, wavelets, singularities and partial differential equations
Author :
Demongeot, J.
Author_Institution :
Univ. Joseph Fourier of Grenoble, Grenoble
fYear :
2007
fDate :
22-26 Aug. 2007
Firstpage :
3474
Lastpage :
3480
Abstract :
We present in this paper a series of operators coming from various domains of mathematical analysis (approximation theory, differential geometry, optimization and partial differential equations (PDE´s)) and able to give adequate responses to low level image processing tasks like contrasting, segmenting and contouring objects of interest in bio-medical images. These operators are essentially based on powerful analytic tools, like splines, wavelets, singularities and PDE´s, which will be described in a brief historical view.
Keywords :
approximation theory; differential geometry; image segmentation; medical image processing; optimisation; partial differential equations; splines (mathematics); wavelet transforms; analytic tools; approximation theory; biomedical images; differential geometry; image contrasting; image processing; image segmentation; medical imaging; object contouring; optimization; partial differential equations; singularities; splines; wavelets; Approximation methods; Biomedical imaging; Geometry; History; Image analysis; Image processing; Image segmentation; Mathematical analysis; Partial differential equations; Wavelet analysis; image processing; partial differential equations; singularities; spline functions; wavelets; Algorithms; Animals; Artificial Intelligence; Computer Simulation; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Models, Biological; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
ISSN :
1557-170X
Print_ISBN :
978-1-4244-0787-3
Type :
conf
DOI :
10.1109/IEMBS.2007.4353079
Filename :
4353079
Link To Document :
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