DocumentCode :
1839050
Title :
Spin-transfer torque magnetoresistive content addressable memory (CAM) cell structure design with enhanced search noise margin
Author :
Xu, Wei ; Zhang, Tong ; Chen, Yiran
Author_Institution :
ECSE Dept., Rensselaer Polytech. Inst., Troy, NY
fYear :
2008
fDate :
18-21 May 2008
Firstpage :
1898
Lastpage :
1901
Abstract :
This paper presents a new memory cell structure for content addressable memory (CAM) based on magnetic tunneling junction (MTJ). Each CAM cell uses a pair of differential MTJs as basic storage element and incorporates transistors to greatly improve the cell search noise margin at low sensing current. Using the same design principle, we further develop an area-efficient cell structure for ternary CAM (TCAM), which occupies about 25% less area compared with directly using two CAM cells to form one TCAM cell. The effectiveness of the proposed CAM and TCAM cell structures has been demonstrated by circuit simulation at 0.18 mum CMOS technology.
Keywords :
CMOS memory circuits; content-addressable storage; magnetoelectronics; magnetoresistive devices; tunnelling magnetoresistance; CMOS technology; area-efficient cell structure; circuit simulation; content addressable memory design; differential MTJ; enhanced cell search noise margin; magnetic tunneling junction; size 0.18 mum; spin-transfer torque magnetoresistive CAM cell structure; Acoustical engineering; Associative memory; CADCAM; CMOS technology; Computer aided manufacturing; Enhanced magnetoresistance; Magnetic tunneling; Magnetization; Torque; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
Type :
conf
DOI :
10.1109/ISCAS.2008.4541813
Filename :
4541813
Link To Document :
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