• DocumentCode
    1839070
  • Title

    PVT-invariant single-to-differential data converter with minimum skew and duty-ratio distortion

  • Author

    Park, Youn-Sik ; Lee, Sung-Wook ; Kong, Bai-Sun ; Park, Kwang-II ; Ihm, Jeong-Don ; Choi, Joo-Sun ; Jun, Young-Hyun

  • Author_Institution
    Sch. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    1902
  • Lastpage
    1905
  • Abstract
    This paper proposes PVT-invariant single-to-differential signal converter (SDQ applicable to the output circuitry of high-speed DDR SDRAM. The proposed SDC generates PVT-invariant differential-output sampling clock using a phase interpolation technique and a symmetric structure, and improves the aperture window of output data in source synchronous DDR SDRAM. The proposed SDC was simulated using 1.8-V 80-nm DRAM technology. The comparison result indicates that the differential clocks generated by the proposed SDC achieve 80.6% reduction of skew, 76.6% reduction of duty-cycle distortion, 61.7% of reduction of delay variation, and 8.5% reduction of maximum current for a given process, voltage, and temperature (PVT) variations, as compared to conventional SDCs. The I/O interface of a source-synchronous DDR SDRAM designed using the proposed SDC, which is operating at 1.0-Gbps/pin data rate has aperture window increased by 15.3% and ISI improved by 67.7% in comparison to conventional I/O interface.
  • Keywords
    DRAM chips; clocks; data conversion; interpolation; I/O interface; PVT-invariant differential-output sampling clock; PVT-invariant single-to-differential data converter; SDQ; duty-cycle distortion; duty-ratio distortion; high-speed DDR SDRAM; output circuitry; phase interpolation technique; source-synchronous DDR SDRAM; Apertures; Circuit simulation; Clocks; DRAM chips; Delay; Interpolation; Random access memory; Sampling methods; Synchronous generators; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4541814
  • Filename
    4541814