• DocumentCode
    1839087
  • Title

    Large-signal modeling of GaN FET and nonlinearity analysis using Volterra series

  • Author

    Islam, S.S. ; Anwar, A.F.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Connecticut Univ., Storrs, CT, USA
  • fYear
    2002
  • fDate
    3-4 June 2002
  • Firstpage
    351
  • Lastpage
    354
  • Abstract
    A large-signal model is reported to investigate the nonlinearities of a GaN MESFET. The model developed accounts for the observed current collapse and frequency dispersion of output resistance and transconductance and uses Volterra series technique to determine the nonlinearities. Calculated f/sub T/ and f/sub max/ of a 0.8 /spl mu/m/spl times/150 /spl mu/m GaN MESFET are 6.5 GHz and 13 GHz, respectively, and are in close agreement with their measured values of 6 GHz and 14 GHz, respectively. For a 1.0 /spl mu/m/spl times/150 /spl mu/m FET operating at 1 GHz, 1-dB compression point and output referred third-order intercept point (OIP3) are 18 dBm and 25.3 dBm, respectively. The corresponding quantities are 19.6 dBm and 30.5 dBm for a 0.6 /spl mu/m/spl times/150 /spl mu/m FET at same frequency. Similar Improvements in third-order intermodulation (IM3) for shorter gate length devices are reported.
  • Keywords
    III-V semiconductors; Volterra series; gallium compounds; intermodulation; microwave field effect transistors; microwave power transistors; power MESFET; semiconductor device models; wide band gap semiconductors; 1 GHz; 13 GHz; 6.5 GHz; Boltzman constant; GaN; MESFET; Volterra series; compression point; current collapse; depletion layer; frequency dispersion; large-signal model; nonlinearity analysis; output referred third-order intercept point; output resistance; third-order intermodulation; transconductance; Current measurement; Electrical resistance measurement; Electron traps; FETs; Frequency; Gallium nitride; MESFETs; Temperature; Thermal conductivity; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    1529-2517
  • Print_ISBN
    0-7803-7246-8
  • Type

    conf

  • DOI
    10.1109/RFIC.2002.1012065
  • Filename
    1012065