Title :
Automated Test System for Microwave Devices
Author :
Daw, Ed ; Grace, Martin
Author_Institution :
Thomas Swidler Wiltron Co.
Abstract :
This paper describes a microwave measurement system designed to address the single connection, multiple measurement testing requirements for active devices. This market is rapidly growing, especially in the rf and microwave semiconductor market place.
Keywords :
Automatic testing; Calibration; Fixtures; Gain measurement; Microwave devices; Microwave measurements; Noise measurement; Scattering parameters; Shape measurement; System testing;
Conference_Titel :
ARFTG Conference Digest-Fall, 42nd
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1993.327042
