DocumentCode :
1839372
Title :
Automated Test System for Microwave Devices
Author :
Daw, Ed ; Grace, Martin
Author_Institution :
Thomas Swidler Wiltron Co.
Volume :
24
fYear :
1993
fDate :
2-3 Dec. 1993
Firstpage :
55
Lastpage :
56
Abstract :
This paper describes a microwave measurement system designed to address the single connection, multiple measurement testing requirements for active devices. This market is rapidly growing, especially in the rf and microwave semiconductor market place.
Keywords :
Automatic testing; Calibration; Fixtures; Gain measurement; Microwave devices; Microwave measurements; Noise measurement; Scattering parameters; Shape measurement; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Fall, 42nd
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1993.327042
Filename :
4119713
Link To Document :
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