• DocumentCode
    1839372
  • Title

    Automated Test System for Microwave Devices

  • Author

    Daw, Ed ; Grace, Martin

  • Author_Institution
    Thomas Swidler Wiltron Co.
  • Volume
    24
  • fYear
    1993
  • fDate
    2-3 Dec. 1993
  • Firstpage
    55
  • Lastpage
    56
  • Abstract
    This paper describes a microwave measurement system designed to address the single connection, multiple measurement testing requirements for active devices. This market is rapidly growing, especially in the rf and microwave semiconductor market place.
  • Keywords
    Automatic testing; Calibration; Fixtures; Gain measurement; Microwave devices; Microwave measurements; Noise measurement; Scattering parameters; Shape measurement; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 42nd
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1993.327042
  • Filename
    4119713
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1839372