DocumentCode
1839525
Title
ESD protection design for 900-MHz RF receiver with 8-kV HBM ESD robustness
Author
Ming-Dou Ker ; Wen-Yu Lo ; Chien-Ming Lee ; Chia-Pei Chen ; Hong-Sing Kao
Author_Institution
Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear
2002
fDate
3-4 June 2002
Firstpage
427
Lastpage
430
Abstract
This paper presents a state-of-art ESD protection design for an RF circuit with a human-body-model (HBM) ESD robustness of 8 kV. By including a turn-on efficient power-rails clamp circuit into the RF circuit, the ESD clamp devices of the RF input pin are operated in the forward-biased conduction, rather than the traditional junction breakdown condition. Therefore, the dimension of ESD devices for the RF input pin can be further downsized to reduce the input capacitance loading for the RF signal. This design has been successfully applied in a 900 MHz RF receiver and fabricated in 0.25 /spl mu/m CMOS process with a thick top metal layer. The experimental results have confirmed that its ESD robustness is as high as >8 kV under the HBM ESD test.
Keywords
CMOS integrated circuits; UHF integrated circuits; electrostatic discharge; protection; radio receivers; 0.25 micron; 8 kV; 900 MHz; CMOS process; ESD clamp devices; ESD protection design; HBM ESD robustness; HBM ESD test; RF circuit; RF input pin; RF receiver; RFIC; forward-biased conduction; human-body model; input capacitance loading reduction; thick top metal layer; turn-on efficient power-rails clamp circuit; CMOS process; Capacitance; Circuits; Clamps; Electric breakdown; Electrostatic discharge; Protection; Radio frequency; Robustness; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
Conference_Location
Seattle, WA, USA
ISSN
1529-2517
Print_ISBN
0-7803-7246-8
Type
conf
DOI
10.1109/RFIC.2002.1012083
Filename
1012083
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