• DocumentCode
    1839635
  • Title

    Microwave dielectric relaxation study of 1-Hexanol with 1-propenol mixture by using time domain reflectometry at 300K

  • Author

    Tidar, Anil ; Shafiyoddin, Sayyad ; Kamble, Siddharth ; Dharne, G.M. ; Patil, S.S. ; Khirade, P.W. ; Mehrotra, S.C.

  • Author_Institution
    Dept. of Phys., Dr. Babasaheb Ambedkar Marathwada Univ., Aurangabd, India
  • fYear
    2009
  • fDate
    14-16 Dec. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Dielectric relaxation measurement of 1-Hexanol (1-HE), 1-Propenol (1-PR) & their complex have been carried out over the entire concentration range using time domain reflectometry technique at 300 K in the frequency range of 10 KHz to 20-GHz. Bilinear calibration method is used to obtain complex permittivity ??*(??) from complex reflection coefficient ??*(??) over the frequency range of 10 MHz to 20 GHz. The Excess inverse relaxation time (1/t)E, Kirkwood correlation factor (geff) and Bruggeman factor (fB) are also estimated to study the solute-solvent interaction. The value of dielectric constant increases & relaxation time decreases with increase in concentration 1-PR in 1-HE. Bruggeman plot shows a non - linearity of the curve for all concentration, indicate the hetero interaction which may be due to hydrogen bonding of the OH group of 1-PR with 1-HE.
  • Keywords
    dielectric relaxation; permittivity; reflectometers; time-domain reflectometry; 1-hexanol; 1-propenol mixture; Bruggeman factor; Bruggeman plot; bilinear calibration method; complex permittivity; complex reflection coefficient; correlation factor; dielectric constant; dielectric relaxation measurement; excess inverse relaxation time; frequency 10 kHz to 20 GHz; hydrogen bonding; microwave dielectric relaxation study; solute-solvent interaction; temperature 300 K; time domain reflectometry; 1-Hexanol; 1-Propanol; Bruggeman factor etc.; Excess permittivity; TDR;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Electromagnetics Conference (AEMC), 2009
  • Conference_Location
    Kolkata
  • Print_ISBN
    978-1-4244-4818-0
  • Electronic_ISBN
    978-1-4244-4819-7
  • Type

    conf

  • DOI
    10.1109/AEMC.2009.5430597
  • Filename
    5430597