• DocumentCode
    1839650
  • Title

    Study of Millimeter-Wave On-Wafer Calibration Techniques and Effect Upon HEMT Parameter Extraction

  • Author

    Nishimoto, M. ; Laskar, J.

  • Author_Institution
    Electrical Engineering Department, University of Hawaii, 2540 Dole Street, Honolulu, Hawaii 96822, 808-956-9737
  • Volume
    25
  • fYear
    1994
  • fDate
    34455
  • Firstpage
    19
  • Lastpage
    23
  • Abstract
    A new procedure has been developed to identify which calibration techniques are most suitable for millimeter-wave, on-wafer measurements. This work quantifies the sources and types of error encountered with SOLT and LRM calibrations in relation to multi-line TRL calibrations at V-band. A sensitivity analysis studies these calibration effects upon InP HEMT parameter extraction at V-Band.
  • Keywords
    Calibration; Coplanar waveguides; HEMTs; Indium phosphide; Millimeter wave measurements; Millimeter wave technology; NIST; Parameter extraction; Scattering parameters; Sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 43rd
  • Conference_Location
    San Diego, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1994.327054
  • Filename
    4119727
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1839650