Title :
Study of Millimeter-Wave On-Wafer Calibration Techniques and Effect Upon HEMT Parameter Extraction
Author :
Nishimoto, M. ; Laskar, J.
Author_Institution :
Electrical Engineering Department, University of Hawaii, 2540 Dole Street, Honolulu, Hawaii 96822, 808-956-9737
Abstract :
A new procedure has been developed to identify which calibration techniques are most suitable for millimeter-wave, on-wafer measurements. This work quantifies the sources and types of error encountered with SOLT and LRM calibrations in relation to multi-line TRL calibrations at V-band. A sensitivity analysis studies these calibration effects upon InP HEMT parameter extraction at V-Band.
Keywords :
Calibration; Coplanar waveguides; HEMTs; Indium phosphide; Millimeter wave measurements; Millimeter wave technology; NIST; Parameter extraction; Scattering parameters; Sensitivity analysis;
Conference_Titel :
ARFTG Conference Digest-Spring, 43rd
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1994.327054
