Title :
High-Q microstrip-fed bulk micromachined silicon cavities
Author :
Stickel, M. ; Kremer, P.C. ; Eleftheriades, G.V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Abstract :
Bulk micromachining of silicon wafers to fabricate rectangular waveguide components has been the focus of much research over the past decade. Over that time, a number of different fabrication techniques have been presented. However, for resonator applications, these fabricated topologies restrict the cavity height to less than two wafer thicknesses. To allow for much deeper cavities, an enabling fabrication procedure for micromachined waveguide components has been proposed. In this paper, a regular height bulk silicon micromachined cavity of constant cross section, fed using a microstrip line, has been presented. The relatively low measured Q/sub 0/ factor for this cavity was due to the poor soldered connections between the top and bottom plates. A new enabling micromachined cavity design has also been introduced, which achieves a very high unloaded (Q/sub 0//spl cong/4500, measured) quality factor.
Keywords :
Q-factor; cavity resonators; elemental semiconductors; micromachining; microstrip lines; rectangular waveguides; silicon; waveguide components; Q factor; Si; bulk micromachined silicon cavities; cavity height; high-Q silicon cavities; micromachined waveguide components; microstrip line; microstrip-fed cavities; rectangular waveguide components; resonators; Anisotropic magnetoresistance; Calibration; Copper; Etching; Metallization; Micromachining; Microstrip; Probes; Resists; Silicon;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2003. IEEE
Conference_Location :
Columbus, OH, USA
Print_ISBN :
0-7803-7846-6
DOI :
10.1109/APS.2003.1219316