Title :
Smoothing gate capacitance models for CMOS radio frequency and microwave integrated circuits CAD
Author_Institution :
Czech Tech. Univ., Praha, Czech Republic
Abstract :
Convergence problems for both voltage- and charge-controlled models of MOSFET gate capacitances are often a limiting factor of CAD tools. In paper, an idea of exponential smoothing of model discontinuities is proposed. The method is demonstrated by smoothing the discontinuity of Meyer´s model at zero drain-source voltage. The updated model is tested on flip-flop circuit by an advanced algorithm.
Keywords :
CMOS integrated circuits; SPICE; capacitance; circuit CAD; field effect MMIC; flip-flops; integrated circuit design; integrated circuit modelling; microwave integrated circuits; smoothing methods; CMOS RFIC CAD; CMOS microwave IC CAD; MOSFET gate capacitances; Meyer model; SPICE3 program; charge-controlled models; circuit interactive analyzer program; convergence problems; discontinuity smoothing; exponential smoothing; flip-flop circuit; gate capacitance models smoothing; model discontinuities; voltage-controlled models; zero drain-source voltage; CMOS integrated circuits; Capacitance; Convergence; Integrated circuit modeling; Microwave integrated circuits; Radio frequency; Radiofrequency integrated circuits; Semiconductor device modeling; Smoothing methods; Voltage;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2002 IEEE
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7246-8
DOI :
10.1109/RFIC.2002.1012100
